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Issue Resolution through Innovative Experiments on
- Optimization of Critical Product and Process Parameters -
Identification and analysis of root causes of specific materials and devices issues by innovative model experiments and analysis techniques have proven to be vital for an increased understanding of material parameters and device characteristics, thereby providing a sound knowledge base to optimize critical product and process parameter including performance, reliability and yield.
Dr. Epperlein is a well recognized expert in this special field, covering solid state devices including semiconductors and superconductors along with many world’s first experimental approaches, pioneered techniques and unique results. Publications received international recognition (see Science Citation Index or Google, Advanced Search / Exact Phrase ‘PW Epperlein’).
As proof, and to convince even you, the sceptical customer, of the effectiveness and potential of creative, experimental issue resolution approaches, please find below some originalities, a compilation of selected innovative experiments conducted to identify and analyse root causes and resolve materials and electrical / optical devices issues with regard to an optimization of critical product and process parameters.
A comprehensive publication is in preparation.
Originalities: Expertise Proven by Facts
Materials and Solid Sate Devices Issue Resolution through Innovative Experimental Approaches
Semiconductors – 17 Topics - click for details
Semi-Insulating GaAs and InP Semiconductor Wafer Quality Uniformity
Quality Measure of Epitaxially-Grown Semiconductor Material
Quantum Well Laser Performance and Reliability
Local Temperatures along Laser Diode Cavities
Laser Diode Mirror Temperatures
Root Cause Analysis and Impact of Increased Laser Mirror Temperatures
Unstable Laser Mirror Coating Material
Highly Localized Hot Spots on Laser Diode Mirror Facets
Temperature – Monitored Laser Degradation Dynamics
High-Power Laser Diode Optimization with Bent-Waveguide Non-Absorbing Etched Mirrors
Mechanical Stress in Laser Diodes
Stress-Induced Defects in Ridge Waveguide Laser Diodes
Deep Level Defects Impact Semiconductor Device Functionality
Laser Diode Emission Characteristics
Laser Diode Reliability
Reliability Qualification Testing
Resonant Tunnelling Diode – Essential Part of a Novel Optical Modulator
Superconductors – 9 Topics - click for details
Superconductor Computer Elements Based on the Josephson Effect
Superconducting Tunnel Junction Barrier Uniformity
Sub-Harmonic Energy Gap Structure
Superconducting Magnetic Penetration Depths
Non-Equilibrium Quasiparticle Distribution in Thin Superconducting Films
Quasiparticle Recombination Times in Superconducting Tunnel Junctions
Density of States at the Fermi Level in Thin Superconducting Films
Monochromatic High-Frequency Phonons
Measurement of e/h by Means of the AC Josephson Effect in Superconducting Tunnel Junctions
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